岩石电阻率图像及各向异性变化的实验研究

张斌, 朱涛, 周建国

张斌, 朱涛, 周建国. 2017: 岩石电阻率图像及各向异性变化的实验研究. 地震学报, 39(4): 478-494. DOI: 10.11939/jass.2017.04.004
引用本文: 张斌, 朱涛, 周建国. 2017: 岩石电阻率图像及各向异性变化的实验研究. 地震学报, 39(4): 478-494. DOI: 10.11939/jass.2017.04.004
Zhang Bin, Zhu Tao, Zhou Jianguo. 2017: Experimental studies on the changes of rock resistivity image and anisotropy. Acta Seismologica Sinica, 39(4): 478-494. DOI: 10.11939/jass.2017.04.004
Citation: Zhang Bin, Zhu Tao, Zhou Jianguo. 2017: Experimental studies on the changes of rock resistivity image and anisotropy. Acta Seismologica Sinica, 39(4): 478-494. DOI: 10.11939/jass.2017.04.004

岩石电阻率图像及各向异性变化的实验研究

基金项目: 

中央级公益性科研院所基本科研业务专项 DQJB13B05

国家自然科学基金 41574083

国家自然科学基金(41574083) 和中央级公益性科研院所基本科研业务专项(DQJB13B05) 共同资助

详细信息
    作者简介:

    张斌  中国地震局地球物理研究所固体地球物理专业在读博士研究生. 2012年防灾科技学院勘查技术与工程专业毕业, 获工学学士学位; 2015年中国地震局地球物理研究所固体地球物理学专业毕业, 获理学硕士学位. 现主要从事地震动衰减关系、 地震电磁模拟实验等方面的研究

    通讯作者:

    朱涛, e-mail: zxl_tao@126.com

  • 中图分类号: P315.72+

Experimental studies on the changes of rock resistivity image and anisotropy

  • 摘要: 在两组人工样品自由表面以中心点为基准对称布设3条辐射状测线,对样品实施单轴应力加载和卸载后,利用电阻率层析成像方法构建了相应的视电阻率相对变化图像,并计算和绘制了表征裂隙产生和发展速率的视电阻率各向异性系数λ*以及表征裂隙产生和发展方位的各向异性主轴方位角α随应力和深度的变化曲线.结果表明:所有测线所对应的RRC图像均随着应力的变化呈现出相同的变化趋势,即在加载阶段,随着应力的增加,视电阻率相对变化图像中电阻率降低区域逐渐收缩,而电阻率升高区域逐渐扩张,在卸载阶段,随着应力的减小,电阻率降低区域继续收缩,电阻率升高区域继续扩张;样品中的高阻体对其所在部位及附近区域的电阻率增幅有较大影响,而对横越高阻体测线的视电阻率相对变化图像的趋势性变化无影响;对于原始电性为各向异性的样品,随着应力的增加,其各向异性程度降低;裂隙主要在岩样的浅部产生和发展,而在较深部位的裂隙产生和发展的速率相对较低.上述结果有助于解释和理解地震、火山活动和大型地质构造运动引起的视电阻率及其各向异性的变化特征,电阻率层析成像方法可能成为目前地震电阻率观测方法的有益补充.
    Abstract: Apparent resistivity data was acquired during the uniaxial compression on two sets of man-made samples. Then we constructed the relative resistivity change (RRC) images corresponding to three radial measuring lines intersecting with the center of a sample surface using electrical resistivity tomography, and plotted the curves of apparent resistivity anisotropy factor λ* and azimuthal angle of anisotropy axis α versus stress and depth. λ* and α represent the rate and direction of crack generation and development respectively. Our results indicate that all RRC images show the same change trend with the change of stress. With the increase of stress, the resistivity-decreased region (RDR) in the RRC images would shrink gradually, while the resistivity-increased region (RIR) would expand gradually. During the process of unload-ing, with the decrease of stress, the RIR continues to expand, and RDR conti-nues to shrink. The high-resistivity block embedded in a sample has a great influence on the resistivity-increased amplitude at its location and surroundings, but little effect on the trending change of resistivity image. For the samples with originally electrical anisotropy, λ* decreases with the increase of stress; Cracks appeared and developed mainly in the shallower part of a rock sample, while in the deeper part, the rate of crack generation and development is much lower, which can help to explain and understand the changes in resistivity and its anisotropy caused by earthquakes, volcanic activities and large-scale tectonic movements. This method could be a useful complement to the current seismic resistivity observation methods.
  • 图  1   样品Ⅰ(a)和样品Ⅱ(b)的测线布设和加压方向示意图

    Figure  1.   Arrangement of measuring lines and directions of loading for sample Ⅰ(a) and sample Ⅱ(b)

    图  2   实验系统示意图

    Figure  2.   Sketch diagram of experimental system

    图  3   温纳-α装置示意图

    A, B为供电电极;MN为测量电极;I为供电电流;ΔV为测量电极间的电位差;a为电极间距

    Figure  3.   Sketch diagram of Wenner-α array

    I indicates the intensity of current between two current electrodes A and B. ΔVindicates the potential difference between two potential elec-trodes M and N, a indicates electrode spacing

    图  4   样品在无压力状态下电阻率重复测量结果相对第一次测量结果的变化图

    Figure  4.   The relative resistivity change by comparing repeated measurement with the first measurement before loading

    图  5   样品Ⅰ(a)和样品Ⅱ(b)的应力(单位为MPa)加载和卸载曲线

    Figure  5.   The stress (in MPa) loading and unloading curves of sample Ⅰ(a) and sample Ⅱ(b)

    图  6   加压前样品Ⅰ和样品Ⅱ中布设的测线L1L2L3观测到的视电阻率图像

    Figure  6.   The apparent resistivity images observed by measuring lines L1, L2, L3 laid in sample Ⅰ and sample Ⅱ before loading

    图  7   加压(左),卸压(右)过程中不同应力下样品中布设的测线L1(a),L2(b) L3(c)观测到的视电阻率相对变化图像

    Figure  7.   Relative resistivity change images observed by measuring lines L1 (a), L2 (b), L3(c) laid in sample Ⅰ. Left column represents loading process, and right column represents unloading process

    图  7   加压(左),卸压(右)过程中不同应力下样品Ⅰ中布设的测线L1 (a), L2 (b),L3(c)观测到的视电阻率相对变化图像

    Figure  7.   Relative resistivity change images observed by measuring lines L1 (a), L2 (b), L3 (c) laid in sample Ⅰ. Left column represents loading process, and right column represents unloading process

    图  8   加压(左),卸压(右)过程中不同应力下样品Ⅱ中布设的测线L1 (a),L2 (b),L3 (c)观测到的视电阻率相对变化图像

    Figure  8.   Relative resistivity change images observed by measuring lines L1(a), L2(b), L3 (c) laid in sample Ⅱ. Left column represents loading process, and right column represents unloading process

    图  8   加压(左),卸压(右)过程中不同应力下样品Ⅱ中布设的测线L1(a), L2(b),L3 (c)观测到的视电阻率相对变化图像

    Figure  8.   Relative resistivity change images observed by measuring lines L1(a), L2(b), L3(c) laid in sample Ⅱ. Left column represents loading process, and right column represents unloading process

    图  9   温纳-α阵列视电阻率数据对选取示意图

    Figure  9.   Sketch diagram of apparent resistivity set extraction for Wenner-α array

    图  10   视电阻率数据对对应的有效深度图

    Figure  10.   Effective depths corresponding to apparent resistivity sets

    图  11   样品Ⅰ在不同有效深度h处的各向异性系数λ*和各向异性主轴方位角α随应力的变化图

    空心圆、三角形和实心圆分别表示应力加、卸载过程及加压前(0 MPa)不同应力对应的λ*α值,下同

    Figure  11.   The changes of λ* and α with stress for sample Ⅰ at different effective depths h

    Open circles, triangles and dots represent values of λ* and α corresponding to different stresses under loading, unloading and before loading, the same below

    图  12   样品Ⅰ在不同深度h处的视电阻率各向异性系数λ*随应力的变化(a)和视电阻率各向异性主轴方位角α的最大值与最小值之差随深度的变化(b)

    Figure  12.   Variations of λ* with stress curves at different depths of sample Ⅰ (a), variations of αmax-αmin with depth curve of sample Ⅰ (b)

    图  13   样品Ⅱ在不同有效深度h处的各向异性系数λ*和各向异性主轴方位角α随应力的变化

    Figure  13.   The changes of λ*and α with stress for sample Ⅱ at different effective depths h

    表  1   MIR-2007直流电法仪的主要技术指标

    Table  1   Main technical indicators of MIR-2007 DC resistivity meter

    输入阻抗/MΩ 电压测量范围/V 电流测量范围/A 供电电压/V 工频抑制/dB 自电补偿方式及范围
    4104 [-4, 4] [-4, 4] ≤700 ≥80 全量程跟踪式
    精度优于±0.5%;分辨率为1 μV 自动补偿
    下载: 导出CSV
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  • 收稿日期:  2016-11-29
  • 修回日期:  2017-02-07
  • 发布日期:  2017-06-30

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